Product News

Under the global epidemic spread of COVID-19, many countries have taken actions to improve ventilation to chase away COVID-19. The targets are to improve the air circulation in public buildings, public offices, museums, theatres, universities and schools, so as to help stop the spread of coronavirus.

In semiconductor manufacturing industry, to minimize yield losses, it is essential for semiconductor fabrication plants (semiconductor fabs) to adopt rigorous contamination control strategies in the cleanrooms. Normally, particulate matter is one of the major sources of micro-contamination in semiconductor manufacturing processes, which needs to be monitored continuously.

Flat panel display (FPD) manufacturing involves the production of various types of displays such as liquid crystal displays (LCDs), organic light-emitting diode (OLED) displays, and others, which requires manufacturing process with precision and cleanliness to ensure high-quality products. Cleanrooms for FPD manufacturing should be designed to minimize the level of particles and also to control the filtered air supply by monitoring temperature, humidity, and pressure levels.

In pharmaceutical manufacturing facilities, controlling airborne particles is essential to ensure the purity and safety of pharmaceutical products. Cubic 2.83LPM Particle Counter OPC-6303 Series and 28.3LPM Particle Counter OPC-6510 Series can be applied for monitor cleanroom indoor environmental conditions of production areas, and storage facilities, meeting regulatory requirements for airborne particulate levels monitoring and control.

In lithium-ion battery manufacturing, particularly in electrode material preparation and cell assembly processes, controlling airborne particulate contamination is crucial to ensure the performance and reliability of battery products. To help monitor and control contamination during battery fabrication process, Cubic has designed 2.83LPM Particle Counter OPC-6303 Series and 28.3LPM Particle Counter OPC-6510 Series, based on its core light scattering technology.

According to a recent World Fab Forecast issued by Semiconductor Equipment Manufacturers International (SEMI), more than 50% of semiconductor yield losses can be attributed to micro-contamination.

Particulate matter pollution is one of the major causes of equipment failure within data centers. Keeping particulate matter pollution in data centers at low levels can reduce equipment failure rates while also cutting down operating costs.